Cluster Secondary Ion Mass Spectrometry: Principles and by Dominic M. Desiderio, Nico M. M. Nibbering, Joseph A.
By Dominic M. Desiderio, Nico M. M. Nibbering, Joseph A. Loo(eds.)
Explores the effect of the most recent breakthroughs in cluster SIMS technology
Cluster secondary ion mass spectrometry (SIMS) is a excessive spatial solution imaging mass spectrometry method, which might be used to symbolize the three-d chemical constitution in complicated natural and molecular platforms. it really works by utilizing a cluster ion resource to sputter desorb fabric from a superior pattern floor. ahead of the arrival of the cluster resource, SIMS was once critically constrained in its skill to represent delicate samples due to harm from the atomic resource. Molecular samples have been primarily destroyed in the course of research, proscribing the method's sensitivity and precluding compositional intensity profiling. using new and rising cluster ion beam applied sciences has all yet eradicated those barriers, allowing researchers to go into into new fields as soon as thought of unimaginable by way of the SIMS technique.
With contributions from top mass spectrometry researchers all over the world, Cluster Secondary Ion Mass Spectrometry: rules and Applications describes the newest breakthroughs in instrumentation, and addresses most sensible practices in cluster SIMS research. It serves as a compendium of data on natural and polymeric floor and in-depth characterization utilizing cluster ion beams. It covers issues starting from the basics and conception of cluster SIMS, to the real chemistries at the back of the good fortune of the process, in addition to the wide-ranging functions of the know-how. Examples of topics lined contain:
- Cluster SIMS thought and modeling
- Cluster ion resource kinds and function expectations
- Cluster ion beams for floor research experiments
- Molecular intensity profiling and 3-D research with cluster ion beams
- Specialty functions starting from organic samples research to semiconductors/metals analysis
- Future demanding situations and clients for cluster SIMS
This publication is meant to learn any scientist, starting from starting to complicated in point, with lots of figures to aid greater comprehend advanced options and techniques. furthermore, every one bankruptcy ends with a close reference set to the first literature, facilitating extra study into person issues the place wanted. Cluster Secondary Ion Mass Spectrometry: ideas and Applications is a must have learn for any researcher within the floor research and/or imaging mass spectrometry fields.Content:
Chapter 1 An advent to Cluster Secondary Ion Mass Spectrometry (Cluster SIMS) (pages 1–11): Christine M. Mahoney and Greg Gillen
Chapter 2 Cluster SIMS of natural fabrics: Theoretical Insights (pages 13–55): Arnaud Delcorte, Oscar A. Restrepo and Bartlomiej Czerwinski
Chapter three Ion resources Used for Secondary Ion Mass Spectrometry (pages 57–75): Albert J. Fahey
Chapter four floor research of natural fabrics with Polyatomic fundamental Ion resources (pages 77–116): Christine M. Mahoney
Chapter five Molecular intensity Profiling with Cluster Ion Beams (pages 117–205): Christine M. Mahoney and Andreas Wucher
Chapter 6 Three?Dimensional Imaging with Cluster Ion Beams (pages 207–246): Andreas Wucher, Gregory L. Fisher and Christine M. Mahoney
Chapter 7 Cluster Secondary Ion Mass Spectrometry (SIMS) For Semiconductor and Metals intensity Profiling (pages 247–268): Greg Gillen and Joe Bennett
Chapter eight Cluster TOF?SIMS Imaging and the Characterization of organic fabrics (pages 269–312): John Vickerman and Nick Winograd
Chapter nine destiny demanding situations and customers of Cluster SIMS (pages 313–327): Peter Williams and Christine M. Mahoney
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Extra info for Cluster Secondary Ion Mass Spectrometry: Principles and Applications
14). In contrast, for fullerite, the number of cross-links restarts to slowly increase after the peak, up to a value of ∼400 at 2 ps. In addition to the absence of “passivating” hydrogen, this is probably due to the very speciﬁc nature of fullerite, where each broken molecule naturally exhibits many reactive radical sites that are prone to induce cross-linking. These results explain the failure of molecular depth proﬁling with C60 for fullerite and fullerene-based photovoltaic materials. Although they do not involve organic materials, two other studies should be mentioned here concerning the simulations of reactions induced by cluster projectiles in solids.
If the number of atoms in the projectile (size, radius) is kept constant, the ejection yield of intact PS4 molecules increases with increasing energy up to a saturation value. The saturation point for intact molecular emission also corresponds to the threshold for the ejection of fragments and substrate atoms (Fig. 20a). When 44 CHAPTER 2 CLUSTER SIMS OF ORGANIC MATERIALS: THEORETICAL INSIGHTS the initial energy of the projectile is constant, the ejection of substrate atoms and molecular fragments decreases with increasing cluster size.
As a result of these two factors, larger energy per atom and less effective energy transfer per collision, small heavy metal clusters are almost not deﬂected in their collisions with the water molecules and then travel particularly far into light-element samples. 31 In this case, Au atoms transfer their energy better than C atoms and C atoms impinging on metal atoms are deﬂected with larger angles (more backscattering). For water ice and organic targets, the ﬁnal result is a deeper and narrower crater in the case of Au3 bombardment, with a sputtering yield that is generally lower.